DocumentCode
1780016
Title
Inception level of partial discharges in SF6 induced with short X-ray pulses
Author
Koch, Martin ; Bujotzek, M. ; Franck, Christian
Author_Institution
Power Syst. & High Voltage Labs., ETH Zurich, Zurich, Switzerland
fYear
2014
fDate
19-22 Oct. 2014
Firstpage
11
Lastpage
14
Abstract
First generation gas insulated switchgears were constructed with large safety margin. Today´s trend is to reduce the size of the switchgears to save material and costs. With increased field strength due to reduced dimensions as well as increased pressure in the compartments, the influence of surface roughness, surface damages and conducting particles is increasing. Therefore the knowledge of the exact inception level of partial discharges due to those imperfections is of interest. The goal of the present contribution is to measure the discharge inception voltage in SF6 in a homogeneous field configuration with a small protrusion with unprecedented high accuracy. With a short pulse X-ray source first electrons are provided within the critical volume. The experimental results show for a 0.2 MPa SF6 insulation a threshold voltage of roughly 80 kV for positive and negative polarity at the protrusion, respectively. These inception voltages match the calculated theoretical inception level. The proposed method allows determining the inception voltage in a more efficient way as the experiment time is reduced.
Keywords
SF6 insulation; X-ray applications; gas insulated switchgear; partial discharges; surface roughness; SF6; SF6 insulation; conducting particles; discharge inception voltage; electrons; field strength; first generation gas insulated switchgears; homogeneous field configuration; inception level; large safety margin; partial discharges; pressure 0.2 MPa; short pulse X-ray source; small protrusion; surface damages; surface roughness; Discharges (electric); Electrodes; Electron tubes; Geometry; Partial discharges; Sulfur hexafluoride; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on
Conference_Location
Des Moines, IA
Type
conf
DOI
10.1109/CEIDP.2014.6995781
Filename
6995781
Link To Document