Monte Carlo studies of hot electron transport and high field degradation

Author

Ying Sun ; Boggs, S.A. ; Ramprasad, Ramamurthy

Author_Institution

Inst. of Mater. Sci., Univ. of Connecticut, Storrs, CT, USA

fYear

2014

fDate

19-22 Oct. 2014

Firstpage

15

Lastpage

18

Abstract

The problem of hot electron transport and energy loss at high electric fields in insulators is of considerable interest in the context of dielectric breakdown and hot carrier induced degradation. Hot electron transport is discussed in terms of electron-phonon scattering in polymeric dielectrics. Monte Carlo (MC) simulation provides the basis for study of hot electron transport in thin polyethylene (PE) films. Electron trajectories and spatial evolution of the electron energy distribution are presented. Possible molecular degradation mechanisms are discussed.

Keywords

Monte Carlo methods; electron-phonon interactions; energy loss of particles; hot carriers; insulators; polymer films; Monte Carlo simulation; dielectric breakdown; electron energy distribution; electron trajectories; electron-phonon scattering; energy loss; high field degradation; hot carrier induced degradation; hot electron transport; insulators; molecular degradation mechanisms; polymeric dielectrics; spatial evolution; thin polyethylene films; Cavity resonators; Degradation; Electric fields; Phonons; Polymers; Scattering; Spontaneous emission; Breakdown; Degradation; Electons; Monte Carlo;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on

Conference_Location

Des Moines, IA

Type

conf

DOI

10.1109/CEIDP.2014.6995782

Filename

6995782