• DocumentCode
    1780210
  • Title

    Codes with locality for two erasures

  • Author

    Prakash, N. ; Lalitha, V. ; Kumar, P.V.

  • Author_Institution
    Electr. Commun. Eng., Indian Inst. of Sci., Bangalore, India
  • fYear
    2014
  • fDate
    June 29 2014-July 4 2014
  • Firstpage
    1962
  • Lastpage
    1966
  • Abstract
    In this paper, we study codes with locality that can recover from two erasures via a sequence of two local, parity-check computations. By a local parity-check computation, we mean recovery via a single parity-check equation associated with small Hamming weight. Earlier approaches considered recovery in parallel; the sequential approach allows us to potentially construct codes with improved minimum distance. These codes, which we refer to as locally 2-reconstructible codes, are a natural generalization along one direction, of codes with all-symbol locality introduced by Gopalan et al, in which recovery from a single erasure is considered. By studying the generalized Hamming weights of the dual code, we derive upper bounds on the minimum distance of locally 2-reconstructible codes and provide constructions for a family of codes based on Turán graphs, that are optimal with respect to this bound. The minimum distance bound derived here is universal in the sense that no code which permits all-symbol local recovery from 2 erasures can have larger minimum distance regardless of approach adopted. Our approach also leads to a new bound on the minimum distance of codes with all-symbol locality for the single-erasure case.
  • Keywords
    Hamming codes; graph theory; parity check codes; Turán graphs; all-symbol local recovery; all-symbol locality; dual code; erasure recovery; local parity-check computations; locally 2-reconstructible codes; single parity-check equation; small Hamming weight; Frequency modulation; Hamming weight; Linear codes; Maintenance engineering; Silicon; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory (ISIT), 2014 IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • Type

    conf

  • DOI
    10.1109/ISIT.2014.6875176
  • Filename
    6875176