Title : 
Group testing with prior statistics
         
        
            Author : 
Tongxin Li ; Chun Lam Chan ; Wenhao Huang ; Kaced, Tarik ; Jaggi, Sidharth
         
        
            Author_Institution : 
Chinese Univ. of Hong Kong, Hong Kong, China
         
        
        
            fDate : 
June 29 2014-July 4 2014
         
        
        
        
            Abstract : 
We consider a new group testing model wherein each item is a binary random variable defined by an a priori probability of being defective. We assume that each probability is small and that items are independent, but not necessarily identically distributed. The goal of group testing algorithms is to identify with high probability the subset of defectives via non-linear (disjunctive) binary measurements. Our main contributions are two classes of algorithms: (1) adaptive algorithms with tests based either on a maximum entropy principle, or on a Shannon-Fano/Huffman code; (2) non-adaptive algorithms. Under loose assumptions and with high probability, our algorithms only need a number of measurements that is close to the information-theoretic lower bound, up to an explicitly-calculated universal constant factor.
         
        
            Keywords : 
Huffman codes; group theory; information theory; probability; Shannon-Fano/Huffman code; disjunctive binary measurements; explicitly-calculated universal constant factor; group testing; information-theoretic lower bound; nonadaptive algorithms; nonlinear binary measurements; Algorithm design and analysis; Entropy; Error probability; Sociology; Statistics; Testing; Vectors;
         
        
        
        
            Conference_Titel : 
Information Theory (ISIT), 2014 IEEE International Symposium on
         
        
            Conference_Location : 
Honolulu, HI
         
        
        
            DOI : 
10.1109/ISIT.2014.6875253