DocumentCode
1780551
Title
An optimal set of code words and correntropy for rotated least squares regression
Author
Jie Gui ; Zhenan Sun ; Guangqi Hou ; Tieniu Tan
Author_Institution
Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
fYear
2014
fDate
Sept. 29 2014-Oct. 2 2014
Firstpage
1
Lastpage
6
Abstract
This paper presents a robust feature extraction method for face recognition based on least squares regression (LSR). Our focus is to enhance the robustness and discriminability of the LSR. First, an optimal set of code words is introduced in LSR. Compared to the traditional set of code words, this new set uses less number of code words. Furthermore, it can make the distance of the regression targets of different classes as large as possible. Then, correntropy is integrated into the LSR model for better robustness. Furthermore, considering the commonly used distance metrics such as Euclidean distance and Cosine distance in the subspace are invariant to rotation transformation, rotation is introduced as additional freedom to promote flexibility without sacrificing accuracy. Our objective function is optimized using half-quadratic (HQ) optimization, which facilitates algorithm development and convergence study. Experimental results show that our method outperforms several subspace methods for face recognition, which indicates the validity of the proposed method.
Keywords
convergence; entropy; face recognition; feature extraction; least squares approximations; quadratic programming; regression analysis; Euclidean distance; HQ optimization; LSR model; algorithm development; code words; convergence study; correntropy; cosine distance; distance metrics; face recognition; half-quadratic optimization; objective function; optimal set; regression target; robust feature extraction method; rotated least squares regression; rotation transformation; Face; Face recognition; Image databases; Principal component analysis; Robustness; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Biometrics (IJCB), 2014 IEEE International Joint Conference on
Conference_Location
Clearwater, FL
Type
conf
DOI
10.1109/BTAS.2014.6996222
Filename
6996222
Link To Document