Title :
Asynchronous Fault Detection in IEEE P1687 Instrument Network
Author :
Shibin, Konstantin ; Devadze, Sergei ; Jutman, Artur
Author_Institution :
Dept. of Comput. Eng. Tallinn, Tallinn Univ. of Technol., Tallinn, Estonia
Abstract :
The paper describes asynchronous fault detection in silicon chips with network of embedded instruments based on IEEE P1687 IJTAG. This technique allows faster fault detection and localization by using asynchronous signal propagation from instruments to instrumentation network controller. The additional hardware is described, scenarios of operation including multiple simultaneous fault detection and localization are analysed.
Keywords :
IEEE standards; elemental semiconductors; fault diagnosis; integrated circuit reliability; silicon; IEEE P1687 IJTAG; IEEE P1687 instrument network; Si; asynchronous fault detection; asynchronous signal propagation; embedded instruments; fault localization; instrumentation network controller; multiple simultaneous fault detection; silicon chips; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Instruments; Registers; Standards; IJTAG; P1687; asynchronous fault detection; fault management;
Conference_Titel :
Test Workshop (NATW), 2014 IEEE 23rd North Atlantic
Conference_Location :
Johnson City, NY
Print_ISBN :
978-1-4799-5134-5
DOI :
10.1109/NATW.2014.24
