DocumentCode
1781113
Title
On the use of physical basis functions in a sparse expansion for electromagnetic scattering signatures
Author
Halman, Jennifer I. ; O´Donnell, A.N. ; Burkholder, Robert J.
Author_Institution
Ohio State Univ., Columbus, OH, USA
fYear
2014
fDate
19-23 May 2014
Abstract
This paper explores the use of physical basis functions as an efficient and insightful sparse expansion for representing the electromagnetic scattering from large finite targets. Such an expansion is central to applying compressed sensing techniques. The closed-form physical optics solution for scattering from an arbitrary flat plate is used to extract the physical basis functions related to scattering mechanisms of edge and corner diffraction, and specular reflection. Orthogonal matching pursuits is applied to find the coefficients of the sparse expansion from the calculated scattered fields of a plate as a function of frequency and angle. Convergence is demonstrated as a function of the number of basis functions and compressed sensing samples.
Keywords
compressed sensing; electromagnetic wave diffraction; electromagnetic wave reflection; electromagnetic wave scattering; iterative methods; physical optics; time-frequency analysis; arbitrary flat plate; closed-form physical optics solution; compressed sensing techniques; corner diffraction; edge diffraction; electromagnetic scattering signatures; large finite targets; orthogonal matching pursuits; physical basis function extraction; sparse expansion coefficients; specular reflection; Compressed sensing; Diffraction; Electromagnetic scattering; Frequency dependence; Reflection; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Radar Conference, 2014 IEEE
Conference_Location
Cincinnati, OH
Print_ISBN
978-1-4799-2034-1
Type
conf
DOI
10.1109/RADAR.2014.6875680
Filename
6875680
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