• DocumentCode
    1781113
  • Title

    On the use of physical basis functions in a sparse expansion for electromagnetic scattering signatures

  • Author

    Halman, Jennifer I. ; O´Donnell, A.N. ; Burkholder, Robert J.

  • Author_Institution
    Ohio State Univ., Columbus, OH, USA
  • fYear
    2014
  • fDate
    19-23 May 2014
  • Abstract
    This paper explores the use of physical basis functions as an efficient and insightful sparse expansion for representing the electromagnetic scattering from large finite targets. Such an expansion is central to applying compressed sensing techniques. The closed-form physical optics solution for scattering from an arbitrary flat plate is used to extract the physical basis functions related to scattering mechanisms of edge and corner diffraction, and specular reflection. Orthogonal matching pursuits is applied to find the coefficients of the sparse expansion from the calculated scattered fields of a plate as a function of frequency and angle. Convergence is demonstrated as a function of the number of basis functions and compressed sensing samples.
  • Keywords
    compressed sensing; electromagnetic wave diffraction; electromagnetic wave reflection; electromagnetic wave scattering; iterative methods; physical optics; time-frequency analysis; arbitrary flat plate; closed-form physical optics solution; compressed sensing techniques; corner diffraction; edge diffraction; electromagnetic scattering signatures; large finite targets; orthogonal matching pursuits; physical basis function extraction; sparse expansion coefficients; specular reflection; Compressed sensing; Diffraction; Electromagnetic scattering; Frequency dependence; Reflection; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radar Conference, 2014 IEEE
  • Conference_Location
    Cincinnati, OH
  • Print_ISBN
    978-1-4799-2034-1
  • Type

    conf

  • DOI
    10.1109/RADAR.2014.6875680
  • Filename
    6875680