• DocumentCode
    17821
  • Title

    High-resolution imaging of defects in CdTe solar cells using thermoreflectance

  • Author

    Katz, Noomi ; Patterson, Maxx ; Zaunbrecher, K. ; Johnston, Samuel ; Hudgings, J.

  • Author_Institution
    Mt. Holyoke College, MA, USA
  • Volume
    49
  • Issue
    24
  • fYear
    2013
  • fDate
    November 21 2013
  • Firstpage
    1559
  • Lastpage
    1561
  • Abstract
    Thermal imaging of solar cells is important for diagnosing nonuniform operation or point defects, which can reduce cell efficiency. However, imaging with infrared light is impractical for superstrate CdTe cells because the glass substrate blocks transmission of light. It is shown that thermoreflectance - a lock-in technique that detects changes in the reflectivity of visible light - can circumvent this problem and achieve thermal images with spatial resolution limited only by the imaging wavelength. The diagnostic is used to show that a particular defect is a resistive shunt.
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2013.1884
  • Filename
    6680434