DocumentCode :
178212
Title :
Emergent Properties from Feature Co-occurrence in Image Collections
Author :
Khan, U.M. ; Mills, S. ; McCane, B. ; Trotman, A.
Author_Institution :
Dept. of Comput. Sci., Univ. of Otago, Dunedin, New Zealand
fYear :
2014
fDate :
24-28 Aug. 2014
Firstpage :
2347
Lastpage :
2352
Abstract :
This paper proposes a novel approach to explore emergent patterns in images in an unsupervised setting. We consider emergent patterns to be sets of co-occurring visual words that appear together more often than chance would indicate. Rather than focusing on finding ways to learn a large number of objects or their categories we focus on analyzing behavior associated with emergent patterns. We show that these patterns emerge from the data and in some cases relate to object identifiers. We extract SIFT descriptors [1] and then cluster them to represent each image as a bag-of-words. To encode co-occurrences between visual words we represent them as edges of a graph which are weighted by the number of images containing a particular co-occurrence. Performing a statistical analysis on weights of the edges identifies words which co-occur significantly more often than expected. These highly co-occurring nodes produce clusters in the graph which can be separated using normalized cuts. Applying normalized cuts reveals that in simple images datasets these emergent clusters can identify object classes. Results on more complex datasets like Caltech101 [2] show that interesting patterns other than object classes can also emerge from the data.
Keywords :
graph theory; image representation; pattern clustering; statistical analysis; transforms; unsupervised learning; Caltech101 datasets; SIFT descriptor extraction; bag-of-words; co-occurrence encoding; co-occurring nodes; co-occurring visual words; emergent clusters; emergent pattern properties; feature co-occurrence; image collections; image datasets; image representation; normalized cuts; object class identification; object identifiers; statistical analysis; unsupervised method; visual words; weighted graph edges; Accuracy; Complexity theory; Eigenvalues and eigenfunctions; Image edge detection; Itemsets; Statistical analysis; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location :
Stockholm
ISSN :
1051-4651
Type :
conf
DOI :
10.1109/ICPR.2014.407
Filename :
6977119
Link To Document :
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