• DocumentCode
    178219
  • Title

    A FAST Extreme Illumination Robust Feature in Affine Space

  • Author

    Peng Ouyang ; Shouyi Yin ; Leibo Liu ; Shaojun Wei

  • Author_Institution
    Microelectron. Inst., Tsinghua Univ., Beijing, China
  • fYear
    2014
  • fDate
    24-28 Aug. 2014
  • Firstpage
    2365
  • Lastpage
    2370
  • Abstract
    Robust feature plays an important role in many vision based applications. This paper proposes a fast extreme illumination robust feature in affine space. It inherits the techniques of extreme point location and main orientation computation from SIFT (Scale Invariant Feature Transform) algorithm, and adopts the rotation and scale invariant circular binary pattern based histograms in the affine space to generate feature vectors of the extreme points. Based on the binary pattern based histograms, this work maximally improves the illumination robustness in affine space and reduces the processing time. Comparing with the typical work-ASIFT(Affine SIFT) that is characterized by strong robustness on the aspects of viewpoint, scale, rotation and illumination, this work improves the robustness for the extreme illumination change in the affine space while maintains the comparable detection performance on the other aspects, and achieves the average 82.6 times improvement on the processing time.
  • Keywords
    affine transforms; computer vision; FAST extreme illumination robust feature; SIFT algorithm; affine space; scale invariant circular binary pattern; scale invariant feature transform algorithm; Detectors; Feature extraction; Histograms; Lighting; Robustness; Testing; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2014 22nd International Conference on
  • Conference_Location
    Stockholm
  • ISSN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2014.410
  • Filename
    6977122