DocumentCode
1782214
Title
Electrical detection of guided light though an optical waveguide by a single metallic contact
Author
Ishii, Shin ; Inoue, Shin-ichiro ; Otomo, Akira
Author_Institution
Adv. ICT Res. Inst., Nat. Inst. of Inf. & Commun. Technol., Kobe, Japan
fYear
2014
fDate
6-10 July 2014
Firstpage
1
Lastpage
2
Abstract
We experimentally demonstrate that a single metallic contact attached to an optical waveguide can electrically detect near-infrared light guided through the waveguide. The device consists of a metal-insulator-metal structure, where hot carriers are generated at the thin metal films. This simple and compact structure allows our device to be integrated to any type of optical waveguide to monitor the guided light.
Keywords
MIM structures; hot carriers; metallic thin films; optical waveguides; electrical detection; guided light; hot carriers; metal-insulator-metal structure; near-infrared light; optical waveguide; single metallic contact; thin metal films; Integrated optics; Metals; Optical device fabrication; Optical films; Optical waveguides; Photodetectors; internal photoemission; metallic thin films; optical waveguides; photodetectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks (ICTON), 2014 16th International Conference on
Conference_Location
Graz
Type
conf
DOI
10.1109/ICTON.2014.6876683
Filename
6876683
Link To Document