Title :
Investigation on realizing 1 Ω current probe complied with IEC 61967-4 direct coupling method
Author :
Yin-Cheng Chang ; Ping-Yi Wang ; Hsu, Shawn S. H. ; Yen-Tang Chang ; Chiu-Kuo Chen ; Hsu-Chen Cheng ; Da-Chiang Chang
Author_Institution :
Nat. Appl. Res. Labs., Nat. Chip Implementation Center, Hsinchu, Taiwan
Abstract :
The practical approach to implement a 1 Ω current probe with verification for measuring the IC conducted emission is proposed. The 1 Ω/150 Ω direct coupling method is reviewed and the considerations on improving the applicable bandwidth of 1 Ω method are discussed. The critical component, 1 Ω resistor which dominates the frequency response, is designed. The realized 1 Ω probe was fully certified with the specification in the IEC 61967-4 standard. The experimental results show the applicable bandwidth of the 1 Ω could cover 1 GHz with accuracy and confidence.
Keywords :
IEC standards; frequency response; integrated circuits; probes; IC conducted emission; IEC 61967-4 direct coupling method; IEC 61967-4 standard; current probe; frequency response; resistor; Calibration; Current measurement; Impedance; Integrated circuits; Probes; Resistors; Standards; 1 Ω current probe; EMC; conducted emission; integrated circuit;
Conference_Titel :
Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo), 2014 International Symposium on
Conference_Location :
Tokyo
