The influence of No Fault Found in analogue CMOS circuits

Author

Jinbo Wan ; Kerkhoff, Hans G.

Author_Institution

Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands

fYear

2014

fDate

17-19 Sept. 2014

Firstpage

1

Lastpage

6

Abstract

The most difficult fault category in electronic systems is the “No Fault Found” (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.

Keywords

CMOS analogue integrated circuits; operational amplifiers; CMOS operational amplifier; analogue CMOS circuits; intermittent resistive fault; no fault found; CMOS integrated circuits; Circuit faults; Integrated circuit interconnections; Integrated circuit modeling; Resistance; Semiconductor device modeling; Signal to noise ratio; NFF; No Fault Found; TSV; analogue CMOS circuits; cold soldering; intermittent resistive faults;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2014 19th International

Conference_Location

Porto Alegre

Type

conf

DOI

10.1109/IMS3TW.2014.6997388

Filename

6997388