An I2C based mixed-signal test and measurement infrastructure

Author

Salazar Escobar, Antonio Jose ; Machado da Silva, Jose ; Correia, Miguel

Author_Institution

INESC TEC, Univ. do Porto, Porto, Portugal

fYear

2014

fDate

17-19 Sept. 2014

Firstpage

1

Lastpage

6

Abstract

The framework being proposed addresses the test and measurement of circuits and systems populated with varying types of sensors and functional blocks, among which one can find embedded test instruments. Its conceptual functionality is based on four types of operations: setup, capture, process, and scan (SCPS), and aims to provide a unifying methodology for managing and synchronizing test operations and instruments. The generalized physical structure and examples of operating commands are described. An application illustrates its use in a particular case.

Keywords

embedded systems; integrated circuit measurement; integrated circuit testing; sensors; synchronisation; system-in-package; system-on-chip; three-dimensional integrated circuits; I2C based mixed-signal test; SCPS; embedded test instruments; interintegrated circuit; measurement infrastructure; setup capture process and scan; Instruments; Registers; Sensor systems; Standards; Synchronization; Testing; I2C; design for testability; embedded instruments; mixed-signal test;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2014 19th International

Conference_Location

Porto Alegre

Type

conf

DOI

10.1109/IMS3TW.2014.6997396

Filename

6997396