Title :
Stochastic model for phase noise measurement from 1-bit signal acquisition
Author :
David-Grignot, Stephane ; Azais, F. ; Latorre, Laurent ; Lefevre, Francois
Author_Institution :
LIRMM, Univ. Montpellier 2, Montpellier, France
Abstract :
This paper presents a novel method for phase noise measurement from 1-bit acquisition of an analog signal. A stochastic model is developed that permits to establish an analytical relationship between the phase noise level present in the analog signal and the characteristics of the binary data captured with a digital ATE. The technique is validated through both simulations and hardware measurements.
Keywords :
automatic test equipment; phase noise; signal detection; stochastic processes; 1-bit signal acquisition; analog signal; binary data; digital ATE; phase noise measurement; stochastic model; Computational modeling; Mathematical model; Noise measurement; Phase measurement; Phase noise; Stochastic processes; Vectors; Phase noise; TE; analog signals; digital signal processing; one bit acquisition; stochastic model;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2014 19th International
Conference_Location :
Porto Alegre
DOI :
10.1109/IMS3TW.2014.6997400
