• DocumentCode
    1784433
  • Title

    Total internal reflection ellipsometry in the investigation of phenomena at surfaces and interfaces for biosensing

  • Author

    Chlpik, J. ; Bombarova, K. ; Cirak, J.

  • Author_Institution
    Dept. of Phys., Slovak Univ. of Technol., Bratislava, Slovakia
  • fYear
    2014
  • fDate
    20-22 Oct. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Ellipsometry, particularly spectroscopic ellipsometry, is a very sensitive, nondestructive experimental technique of thin film characterisation. The recently proposed method of Total internal reflection ellipsometry (TIRE) combines the advantages of spectroscopic ellipsometry and the Kretschmann type SPR geometry of total internal reflection. The modeling reveals detection limit of changes in the bulk refractive index, Δnb= 1.5×10-6 which represents the instrumental potential for detecting an analyte at several pmol/liter in a solution. These results were proven by experimental studies on monitoring changes in adsorbed layers (at the metal / dielectric interface) caused by specific binding of biomolecules from the surrounding solution.
  • Keywords
    bio-optics; biosensors; ellipsometry; Kretschmann type SPR geometry; biosensing; bulk refractive index; interface phenomena; nondestructive experimental technique; spectroscopic ellipsometry; surface phenomena; thin film characterisation; total internal reflection ellipsometry; Ellipsometry; Metals; Optical surface waves; Plasmons; Reflection; Surface waves; Tires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
  • Conference_Location
    Smolenice
  • Print_ISBN
    978-1-4799-5474-2
  • Type

    conf

  • DOI
    10.1109/ASDAM.2014.6998699
  • Filename
    6998699