DocumentCode :
1784457
Title :
Advanced methodology for fast 3-D TCAD electrothermal simulation of power devices
Author :
Chvala, Ales ; Donoval, Daniel ; Marek, Jiri ; Pribytny, Patrik ; Molnar, Miklos
Author_Institution :
Inst. of Electron. & Photonics, Slovak Univ. of Technol. in Bratislava, Bratislava, Slovakia
fYear :
2014
fDate :
20-22 Oct. 2014
Firstpage :
1
Lastpage :
4
Abstract :
In this paper the new methodology for fast 3-D electrothermal simulation of complex power devices including the package and cooling assemblies is proposed and illustrated. A power MOSFET under an unclamped inductive switching (UIS) test of the device robustness is used to perform validation of the designed electrothermal simulation. The presented simulation approach contributes to full analysis of complex structures at high speed of simulation and simplicity of implementation. The methodology is developed for co-simulation platform SMAC.
Keywords :
power MOSFET; semiconductor device models; semiconductor device packaging; semiconductor device testing; technology CAD (electronics); thermal management (packaging); 3D TCAD electrothermal simulation; SMAC cosimulation platform; UIS test; cooling assemblies; power MOSFET; power devices; unclamped inductive switching test; Analytical models; Finite element analysis; Integrated circuit modeling; MOSFET; Mathematical model; Semiconductor device modeling; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
Conference_Location :
Smolenice
Print_ISBN :
978-1-4799-5474-2
Type :
conf
DOI :
10.1109/ASDAM.2014.6998711
Filename :
6998711
Link To Document :
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