• DocumentCode
    1785368
  • Title

    A new ultra low leakage and high speed technique for CMOS circuits

  • Author

    Lorenzo, Rohit ; Chaudhury, Santanu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Inst. of Technol., Silchar, India
  • fYear
    2014
  • fDate
    28-30 May 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents a comprehensive survey and analysis of various subthreshold leakage power reduction techniques. Moreover, a new technique for low leakage and high speed is also proposed here. As the technology scales down to deep sub micron level, leakage power dissipation increases very rapidly due to the high transistor density, low threshold and ultrathin dielectric. The new proposed circuit technique includes NMOS sleep and helper transistors to reduce leakage current with appropriate W/L ratio. The proposed design gives high speed performance because it includes NMOS transistor in the design which is having higher electron mobility. Post layout simulation of XOR gate using microwind tool with 45nm Berkeley predictive technology model shows that the new circuit technique achieves significant power reduction during a standby mode with lesser delay.
  • Keywords
    CMOS logic circuits; MOSFET circuits; high-speed integrated circuits; leakage currents; logic gates; low-power electronics; Berkeley predictive technology model; CMOS circuits; NMOS helper transistors; NMOS sleep transistors; W/L ratio; XOR gate; circuit technique; deep sub micron level; electron mobility; high speed technique; high transistor density; leakage current reduction; leakage power dissipation; microwind tool; post layout simulation; size 45 nm; subthreshold leakage power reduction techniques; ultra low leakage; ultrathin dielectric; Leakage power dissipation; power gating; sleep transistor and transistor stacking; sub threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering and Systems (SCES), 2014 Students Conference on
  • Conference_Location
    Allahabad
  • Print_ISBN
    978-1-4799-4940-3
  • Type

    conf

  • DOI
    10.1109/SCES.2014.6880047
  • Filename
    6880047