DocumentCode :
1785558
Title :
The upset-fault-observer: A concept for self-healing adaptive fault tolerance
Author :
Navas, Byron ; Oberg, Johnny ; Sander, Ingo
Author_Institution :
Dept. of Electron. Syst., KTH R. Inst. of Technol., Stockholm, Sweden
fYear :
2014
fDate :
14-17 July 2014
Firstpage :
89
Lastpage :
96
Abstract :
Advancing integration reaching atomic-scales makes components highly defective and unstable during lifetime. This demands paradigm shifts in electronic systems design. FPGAs are particularly sensitive to cosmic and other kinds of radiations that produce single-event-upsets (SEU) in configuration and internal memories. Typical fault-tolerance (FT) techniques combine triple-modular-redundancy (TMR) schemes with run-time-reconfiguration (RTR). However, even the most successful approaches disregard the low suitability of fine-grain redundancy in nano-scale design, poor scalability and programmability of application specific architectures, small performance-consumption ratio of board-level designs, or scarce optimization capability of rigid redundancy structures. In that context, we introduce an innovative solution that exploits the flexibility, reusability, and scalability of a modular RTR SoC approach and reuse existing RTR IP-cores in order to assemble different TMR schemes during run-time. Thus, the system can adaptively trigger the adequate self-healing strategy according to execution environment metrics and user-defined goals. Specifically the paper presents: (a) the upset-fault-observer (UFO), an innovative run-time self-test and recovery strategy that delivers FT on request over several function cores but saves the redundancy scalability cost by running periodic reconfigurable TMR scan-cycles, (b) run-time reconfigurable TMR schemes and self-repair mechanisms, and (c) an adaptive software organization model to manage the proposed FT strategies.
Keywords :
fault tolerant computing; redundancy; FPGA; FT strategies; RTR; SEU; UFO; adaptive software organization model; board level designs; electronic systems design; fine grain redundancy; integration reaching atomic scales; nanoscale design; performance consumption ratio; periodic reconfigurable TMR scan cycles; recovery strategy; redundancy scalability cost; reusability; rigid redundancy structures; run time reconfiguration; run-time reconfigurable TMR schemes; scarce optimization capability; self-healing adaptive fault tolerance; self-healing strategy; single event upsets; triple modular redundancy; upset fault observer; Fault tolerant systems; Hardware; Redundancy; Software; System-on-chip; Tunneling magnetoresistance; adaptive embedded systems; fault-tolerance; hardware systems; partial and run-time-reconfiguration; reconfigurable IP-cores; reconfigurable computing; self-configuration; self-healing; system-on-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adaptive Hardware and Systems (AHS), 2014 NASA/ESA Conference on
Conference_Location :
Leicester
Type :
conf
DOI :
10.1109/AHS.2014.6880163
Filename :
6880163
Link To Document :
بازگشت