Title :
A model for variation- and fault-tolerant digital logic using self-assembled nanowire architectures
Author :
Goudarzi, Arman ; Lakin, Matthew R. ; Stefanovic, Darko ; Teuscher, Christof
Author_Institution :
Dept. of Comput. Sci., Univ. of New Mexico, Albuquerque, NM, USA
Abstract :
Reconfiguration has been used for both defect- and fault-tolerant nanoscale architectures with regular structure. Recent advances in self-assembled nanowires have opened doors to a new class of electronic devices with irregular structure. For such devices, reservoir computing has been shown to be a viable approach to implement computation. This approach exploits the dynamical properties of a system rather than specifics of its structure. Here, we extend a model of reservoir computing, called the echo state network, to reflect more realistic aspects of self-assembled nanowire networks. As a proof of concept, we use echo state networks to implement basic building blocks of digital computing: AND, OR, and XOR gates, and 2-bit adder and multiplier circuits. We show that the system can operate perfectly in the presence of variations five orders of magnitude higher than ITRS´s 2005 target, 6%, and achieves success rates 6 times higher than related approaches at half the cost. We also describe an adaptive algorithm that can detect faults in the system and reconfigure it to resume perfect operational condition.
Keywords :
adders; fault diagnosis; logic gates; multiplying circuits; nanowires; self-assembly; AND gate; ITRS 2005 target; OR gate; XOR gate; adder; defect-tolerant nanoscale architecture; digital computing; echo state network; electronic device; fault detection; fault-tolerant digital logic; fault-tolerant nanoscale architecture; multiplier circuit; reservoir computing; self-assembled nanowire architecture; variation-tolerant digital logic; word length 2 bit; Computational modeling; Computer architecture; Nanoscale devices; Reservoirs; Self-assembly; Training; Transfer functions;
Conference_Titel :
Nanoscale Architectures (NANOARCH), 2014 IEEE/ACM International Symposium on
Conference_Location :
Paris
DOI :
10.1109/NANOARCH.2014.6880504