DocumentCode :
1785721
Title :
Refractive index of In1−xGaxAsyP1−y lattice-matched to InP in IR-transparent and absorption region
Author :
Seifert, Stefan ; Runge, Patrick
Author_Institution :
Fraunhofer Inst. for Telecommun., Heinrich Hertz Inst., Berlin, Germany
fYear :
2014
fDate :
11-15 May 2014
Firstpage :
1
Lastpage :
2
Abstract :
For several compositions of In1-xGaxAsyP1-y lattice-matched to InP spectroscopic measurements were made. With the help of the Tanguy model, the refractive indices are calculated in the infrared transparent and absorption region. From these measurements general parameters for the Tanguy model are derived for the In1-xGaxAsyP1-y material system lattice-matched to InP.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; infrared spectra; refractive index; In1-xGaxAsyP1-y; InP spectroscopic measurements; Tanguy model; infrared absorption region; infrared transparent region; refractive index; Absorption; Ellipsometry; Indium phosphide; Photonic band gap; Refractive index; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials (IPRM), 26th International Conference on
Conference_Location :
Montpellier
Type :
conf
DOI :
10.1109/ICIPRM.2014.6880521
Filename :
6880521
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1785721
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