DocumentCode
1785730
Title
Frequency increase in resonant-tunneling-diode terahertz oscillators using optimum collector spacer
Author
Kanaya, Haruichi ; Sogabe, R. ; Maekawa, Takuya ; Suzuki, Satoshi ; Asada, Minoru
Author_Institution
Interdiscipl. Grad. Sch. of Sci. & Eng., Tokyo Inst. of Technol., Tokyo, Japan
fYear
2014
fDate
11-15 May 2014
Firstpage
1
Lastpage
2
Abstract
We report an increase in oscillation frequency of room-temperature terahertz oscillators using AIAs/InGaAs resonant tunneling diodes (RTDs) with optimized collector spacer thickness. Because of the trade-off relation between the capacitance and electron transit time for the spacer thickness, an optimum thickness exists in terms of the oscillation frequency. The highest frequency in this experiment was 1.42 THz at the optimum spacer thickness of 12 nm with an output power of ~1 μW. A fundamental oscillation at a frequency >2 THz and output power of ~300 μW at 1 THz are theoretically possible by optimized structures of RTD and antenna.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; resonant tunnelling diodes; submillimetre wave diodes; submillimetre wave oscillators; terahertz wave devices; AlAs-InGaAs; RTDs; antenna; electron transit time; frequency 1 THz; optimized collector spacer thickness; optimum collector spacer; oscillation frequency; resonant-tunneling-diode terahertz oscillators; room-temperature terahertz oscillators; size 12 nm; temperature 293 K to 298 K; Capacitance; Delays; Oscillators; Power generation; Resonant frequency; Resonant tunneling devices; Time-frequency analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials (IPRM), 26th International Conference on
Conference_Location
Montpellier
Type
conf
DOI
10.1109/ICIPRM.2014.6880526
Filename
6880526
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