• DocumentCode
    1786154
  • Title

    Asymmetric self-cascode FD SOI nMOSFETS harmonic distortion at cryogenic temperatures

  • Author

    d´Oliveira, Ligia Martins ; Trevisoli Doria, Rodrigo ; Pavanello, Marcelo Antonio ; de Souza, M. ; Kilchytska, V. ; Flandre, Denis

  • Author_Institution
    Electr. Eng. Dept., Centro Univ. da FEI, Sao Bernardo, Brazil
  • fYear
    2014
  • fDate
    7-9 July 2014
  • Firstpage
    57
  • Lastpage
    60
  • Abstract
    This paper presents an analysis on the linearity of Asymmetric Self-Cascode (A-SC) of FD SOI nMOSGET transistors at cryogenic temperatures. This is achieved by evaluating experimental results of associations of transistors with various combinations of channel doping, obtained at temperatures ranging between liquid helium temperature (LHT, 4K) and room temperature (300K). It has been observed that A-SC presents better analog characteristics than the Symmetric Self-Cascode (S-SC) even at temperatures below 100K. The results show improved harmonic distortion at cryogenic temperatures and for structures composed by transistors with lower channel doping.
  • Keywords
    MOSFET; cryogenic electronics; elemental semiconductors; harmonic distortion; semiconductor doping; silicon; silicon-on-insulator; A-SC; LHT; S-SC; Si; asymmetric self-cascode FD SOI nMOSFET transistor; channel doping; cryogenic temperature; harmonic distortion; liquid helium temperature; symmetric self-cascode; temperature 4 K to 300 K; SOI nMOSFETS; analog parameters; harmonic distortion; liquid helium temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Temperature Electronics (WOLTE), 2014 11th International Workshop on
  • Conference_Location
    Grenoble
  • Type

    conf

  • DOI
    10.1109/WOLTE.2014.6881025
  • Filename
    6881025