DocumentCode
1786154
Title
Asymmetric self-cascode FD SOI nMOSFETS harmonic distortion at cryogenic temperatures
Author
d´Oliveira, Ligia Martins ; Trevisoli Doria, Rodrigo ; Pavanello, Marcelo Antonio ; de Souza, M. ; Kilchytska, V. ; Flandre, Denis
Author_Institution
Electr. Eng. Dept., Centro Univ. da FEI, Sao Bernardo, Brazil
fYear
2014
fDate
7-9 July 2014
Firstpage
57
Lastpage
60
Abstract
This paper presents an analysis on the linearity of Asymmetric Self-Cascode (A-SC) of FD SOI nMOSGET transistors at cryogenic temperatures. This is achieved by evaluating experimental results of associations of transistors with various combinations of channel doping, obtained at temperatures ranging between liquid helium temperature (LHT, 4K) and room temperature (300K). It has been observed that A-SC presents better analog characteristics than the Symmetric Self-Cascode (S-SC) even at temperatures below 100K. The results show improved harmonic distortion at cryogenic temperatures and for structures composed by transistors with lower channel doping.
Keywords
MOSFET; cryogenic electronics; elemental semiconductors; harmonic distortion; semiconductor doping; silicon; silicon-on-insulator; A-SC; LHT; S-SC; Si; asymmetric self-cascode FD SOI nMOSFET transistor; channel doping; cryogenic temperature; harmonic distortion; liquid helium temperature; symmetric self-cascode; temperature 4 K to 300 K; SOI nMOSFETS; analog parameters; harmonic distortion; liquid helium temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Temperature Electronics (WOLTE), 2014 11th International Workshop on
Conference_Location
Grenoble
Type
conf
DOI
10.1109/WOLTE.2014.6881025
Filename
6881025
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