Particle Swarm Optimization guided multi-frequency power-aware System-on-Chip test scheduling using window-based peak power model

This paper presents a multi-frequency test scheduling strategy for System-on-chip (SoC) under power constraint. While existing approaches consider either global peak or cycle-accurate power model, the proposed work considers an intermediate approach to reduce the power overestimation of global peak power model as well as the computational complexity of cycle-accurate power model. A Particle Swarm Optimization (PSO) guided test scheduling strategy has been integrated with our new window-based peak power model to reduce Test Application Time (TAT) over global peak power model. Experimental results show that further improvement in TAT can be achieved using multi-frequency test environment over single-frequency test approach.