DocumentCode :
1786707
Title :
One-shot calibration of rf circuits based on non-intrusive sensors
Author :
Andraud, Martin ; Stratigopoulos, Haralampos-G ; Simeu, Emmanuel
Author_Institution :
Grenoble INP, UJF, Grenoble, France
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1
Lastpage :
6
Abstract :
We propose a post-fabrication calibration technique for RF circuits that is performed during production testing with minimum extra cost. Calibration is enabled by equipping the circuit with tuning knobs and sensors. Optimal tuning knob identification is achieved in one-shot based on a single test step that involves measuring the sensor outputs once. For this purpose, we rely on variation-aware sensors which provide measurements that remain invariant under tuning knob changes. As an auxiliary benefit, the variation-aware sensors are non-intrusive and totally transparent to the circuit. The technique is demonstrated on a 65nm RF power amplifier.
Keywords :
calibration; integrated circuit testing; radiofrequency integrated circuits; radiofrequency power amplifiers; sensors; tuning; RF circuits; RF power amplifier; nonintrusive sensors; post fabrication calibration technique; production testing; size 65 nm; tuning knobs; variation-aware sensors; Calibration; Integrated circuit modeling; Predictive models; Radio frequency; Sensors; System-on-chip; Tuning; Analog/RF IC calibration and testing; non-intrusive sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Type :
conf
Filename :
6881337
Link To Document :
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