Title :
On trading wear-leveling with heal-leveling
Author :
Yu-Ming Chang ; Yuan-Hao Chang ; Jian-Jia Chen ; Tei-Wei Kuo ; Hsiang-Pang Li ; Hang-Ting Lue
Author_Institution :
Emerging Syst. Lab., Macronix Int. Co., Ltd., Hsinchu, Taiwan
Abstract :
Manufacturers are constantly seeking to increase flash memory density in order to fulfill the ever growing demand for storage capacity. However, this trend significantly reduces the reliability and endurance of flash memory chips. The lifetime degradation worsens as the number of erase cycles grows, even with wear leveling technology being adopted to extend flash memory lifetime by evenly distributing erase cycles to every flash block. To address this issue, self-healing technology is proposed to recover a flash block before the flash block is worn out, but such a technology still has its limitation when recovering flash blocks. In contrast to the existing wear leveling designs, we adopt the self-healing technology to propose a heal-leveling design that evenly distributes healing cycles to flash blocks. Ultimately, heal-leveling aims to extend the lifetime of flash memory without introducing a large amount of live-data copying overheads. We conducted a series of experiments to evaluate the capability of the proposed design. The results show that our design can significantly improve the access performance and the effective lifetime of flash memory without the unnecessary overheads caused by wear leveling technology.
Keywords :
fault tolerant computing; flash memories; performance evaluation; access performance improvement; flash block recovery; flash memory chip endurance; flash memory chip reliability; flash memory density; flash memory lifetime degradation; heal-leveling design; live-data copying overheads; self-healing technology; storage capacity; trading wear-leveling; Ash; Heating; Process control; Reliability; Safety; Servers; Thigh; endurance; flash memory; reliability; self-healing; wear leveling;
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA