• DocumentCode
    1786886
  • Title

    Approximate property checking of mixed-signal circuits

  • Author

    Mukherjee, Partha ; Amin, Chirayu S. ; Peng Li

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Growing circuit complexity and design uncertainty has made it difficult to predict whether large circuits meet target property specifications. To address this, we conservatively approximate the failure probability estimate by defining an interval that bounds this probability. Doing so using an arbitrary sampling distribution requires a learner. Given that the learner´s knowledge is imperfect, the interval must first capture its uncertainty. An ensemble of such learners can then be used to compensate for the bias. Lastly, we develop an adaptive sampling scheme to tighten the obtained interval with increased simulation resources, thus controlling the accuracy vs. turn-around-time trade-off.
  • Keywords
    circuit complexity; integrated circuit reliability; mixed analogue-digital integrated circuits; probability; adaptive sampling; approximate property checking; arbitrary sampling distribution; circuit complexity; design uncertainty; failure probability estimate; mixed signal circuits; turn-around-time tradeoff; Adaptation models; Data models; Equations; Mathematical model; Monte Carlo methods; SPICE; Uncertainty; Analog circuits; Mixed analog digital integrated circuits; Model checking; Sampling methods; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2593069.2593091
  • Filename
    6881442