DocumentCode :
1786987
Title :
Run-time technique for simultaneous aging and power optimization in GPGPUs
Author :
Xiaoming Chen ; Yu Wang ; Yun Liang ; Yuan Xie ; Huazhong Yang
Author_Institution :
Dept. of EE, Tsinghua Univ., Beijing, China
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1
Lastpage :
6
Abstract :
High-performance general-purpose graphics processing units (GPGPUs) may suffer from serious power and negative bias temperature instability (NBTI) problems. In this paper, we propose a framework for run-time aging and power optimization. Our technique is based on the observation that many GPGPU applications achieve optimal performance with only a portion of cores due to either bandwidth saturation or shared resource contention. During run-time, given the dynamically tracked NBTI-induced threshold voltage shift and the problem size of GPGPU applications, our algorithm returns the optimal number of cores using detailed performance modeling. The unused cores are power-gated for power saving and NBTI recovery. Experiments show that our proposed technique achieves on average 34% reduction in NBTI-induced threshold voltage shift and 19% power reduction, while the average performance degradation is less than 1%.
Keywords :
graphics processing units; multiprocessing systems; negative bias temperature instability; parallel processing; performance evaluation; power aware computing; GPGPU applications; NBTI recovery; bandwidth saturation; dynamically tracked NBTI-induced threshold voltage shift; high-performance general-purpose graphic processing units; negative bias temperature instability problems; performance degradation; performance modeling; power optimization; power saving; power-gated unused cores; run-time aging; shared resource contention; Bandwidth; Computational modeling; Degradation; Graphics processing units; Instruction sets; Kernel; Optimization; General-purpose graphics processing unit (GPGPU); Negative bias temperature instability (NBTI); power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1145/2593069.2593208
Filename :
6881495
Link To Document :
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