• DocumentCode
    1787025
  • Title

    Window size influence on SSIM fidelity

  • Author

    Golestani, Hossein Bakhshi ; Ghanbari, Mohammad

  • Author_Institution
    Electrical Engineering Department, Sharif University of Technology, Tehran, Iran
  • fYear
    2014
  • fDate
    9-11 Sept. 2014
  • Firstpage
    355
  • Lastpage
    360
  • Abstract
    It has been claimed that to calculate local Structural Similarity (SSIM) index, it is better to employ an 11×11 Gaussian window (called standard SSIM index). In this paper, this claim will be evaluated and shown that contrary to popular belief, not only the standard SSIM index is not always well correlated to the MOS scores but also in some distortion types, its illusory results may be deceiving and cause some wrong comparisons. To enhance the Pearson Cross Correlation (PCC) score, the SSIM indices should be tuned such that a clear and sharp relationship can be found between the SSIM indices and the MOS scores. This paper employs the local window size as a tuning tool and studies its influences on the PCC score. The simulation results show that larger local window is better for distortions with larger signal-error cross-correlation while smaller ones are better for distortions with lower cross-correlation.
  • Keywords
    AWGN; Correlation; Decision support systems; Indexes; Nonlinear distortion; Xenon; Image Quality Assessment; SSIM-MOS matching; Structural Similarity (SSIM) Index; Window Size;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications (IST), 2014 7th International Symposium on
  • Conference_Location
    Tehran
  • Print_ISBN
    978-1-4799-5358-5
  • Type

    conf

  • DOI
    10.1109/ISTEL.2014.7000728
  • Filename
    7000728