DocumentCode
1787025
Title
Window size influence on SSIM fidelity
Author
Golestani, Hossein Bakhshi ; Ghanbari, Mohammad
Author_Institution
Electrical Engineering Department, Sharif University of Technology, Tehran, Iran
fYear
2014
fDate
9-11 Sept. 2014
Firstpage
355
Lastpage
360
Abstract
It has been claimed that to calculate local Structural Similarity (SSIM) index, it is better to employ an 11×11 Gaussian window (called standard SSIM index). In this paper, this claim will be evaluated and shown that contrary to popular belief, not only the standard SSIM index is not always well correlated to the MOS scores but also in some distortion types, its illusory results may be deceiving and cause some wrong comparisons. To enhance the Pearson Cross Correlation (PCC) score, the SSIM indices should be tuned such that a clear and sharp relationship can be found between the SSIM indices and the MOS scores. This paper employs the local window size as a tuning tool and studies its influences on the PCC score. The simulation results show that larger local window is better for distortions with larger signal-error cross-correlation while smaller ones are better for distortions with lower cross-correlation.
Keywords
AWGN; Correlation; Decision support systems; Indexes; Nonlinear distortion; Xenon; Image Quality Assessment; SSIM-MOS matching; Structural Similarity (SSIM) Index; Window Size;
fLanguage
English
Publisher
ieee
Conference_Titel
Telecommunications (IST), 2014 7th International Symposium on
Conference_Location
Tehran
Print_ISBN
978-1-4799-5358-5
Type
conf
DOI
10.1109/ISTEL.2014.7000728
Filename
7000728
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