DocumentCode :
1787290
Title :
Innovative Computerized Non-invasive Intracranial Pressure Measurement Technology and Its Clinical Validation
Author :
Krakauskaite, Solventa ; Petkus, Vytautas ; Zakelis, Rolandas ; Bartusis, Laimonas ; Chomskis, Romanas ; Ragauskas, Arminas
Author_Institution :
Telematics Sci. Centre, Kaunas Univ. of Technol., Kaunas, Lithuania
fYear :
2014
fDate :
27-29 May 2014
Firstpage :
451
Lastpage :
454
Abstract :
An innovative non-invasive absolute intracranial pressure (aICP) measurement method has been validated by multicenter comparative clinical studies. The method is based on two-depth transcranial Doppler technology and employs intracranial and extra cranial segments of the ophthalmic artery as a pressure sensor. The ophthalmic artery is used as a natural pair of scales which compares aICP with controlled pressure aPe which is externally applied to the orbit. In the case of scales balance, aICP=aPe. A two-depth transcranial Doppler device is used as a pressure balance indicator. The proposed method is the only non-invasive aICP measurement method which does not need patient-specific calibration.
Keywords :
Doppler measurement; biomedical measurement; blood vessels; computerised instrumentation; medical computing; pressure measurement; pressure sensors; absolute intracranial pressure measurement method; clinical validation; computerized noninvasive intracranial pressure measurement technology; controlled pressure aPe; extracranial ophthalmic artery segments; intracranial ophthalmic artery segments; multicenter comparative clinical studies; noninvasive aICP measurement method; pressure balance indicator; pressure sensor; two-depth transcranial Doppler technology; Arteries; Blood flow; Doppler effect; Extraterrestrial measurements; Iterative closest point algorithm; Pressure measurement; Ultrasonic variables measurement; clinical validation; intracranial pressure; non-invasive technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Based Medical Systems (CBMS), 2014 IEEE 27th International Symposium on
Conference_Location :
New York, NY
Type :
conf
DOI :
10.1109/CBMS.2014.40
Filename :
6881924
Link To Document :
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