• DocumentCode
    1787592
  • Title

    BIST-PUF: Online, hardware-based evaluation of physically unclonable circuit identifiers

  • Author

    Hussain, Siam U. ; Yellapantula, Sudha ; Majzoobi, Mehrdad ; Koushanfar, Farinaz

  • Author_Institution
    ECE Dept., Rice Univ., Houston, TX, USA
  • fYear
    2014
  • fDate
    2-6 Nov. 2014
  • Firstpage
    162
  • Lastpage
    169
  • Abstract
    Physical Unclonable Functions (PUF) are of increasing importance due to their many hardware security applications including chip fingerprinting, metering, authentication, anti-counterfeiting, and supply-chain tracing, e.g., DARPA SHIELD. This paper presents BIST-PUF, the first built-in-self-test (BIST) methodology for online evaluation of weak and strong PUFs. BIST-PUF provides a paradigm shift in the evaluation of the un-clonable circuit identifiers: unlike earlier known PUF evaluation suites that are software-based and offline, BIST-PUF enables on-the-fly assessment of the desired PUF properties all in hardware. More specifically, the BIST-PUF structure is designed to evaluate two main properties of PUFs, namely unpredictability and stability. These properties are important for ensuring robustness and security in face of operational, structural, and environmental fluctuations due to variations, aging or adversarial acts. For BIST-PUF unpredictability evaluation, we identify and adopt the tests of randomness that are amenable to hardware implementation. For stability assessment, the BIST-PUF suggests three distinct methods, namely, sensor-based, parametric interrogation, and multiple interrogations. Proof-of-concept implementation of the BIST-PUF in FPGA demonstrates its low overhead, effectiveness, and practicality.
  • Keywords
    built-in self test; field programmable gate arrays; BIST-PUF unpredictability evaluation; FPGA; PUF online hardware-based evaluation; built-in-self-test methodology; hardware security applications; multiple interrogations; parametric interrogation; physical unclonable functions; physically unclonable circuit identifiers; sensor-based methods; Built-in self-test; Circuit stability; Delays; Hardware; Robustness; Security; BIST; Built In Self Test; DARPA SHIELD; Hardware security; PUF; Physical Unclonable Functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2014 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/ICCAD.2014.7001347
  • Filename
    7001347