Title :
Accurate full-chip estimation of power map, current densities and temperature for EM assessment
Author :
Chew, Marko ; Aslyan, Ara ; Choy, Jun-ho ; Xin Huang
Author_Institution :
Mentor Graphics Inc., Fremont, CA, USA
Abstract :
Full-chip power ground electro-migration assessment requires a power map, thermal map and checks for IR drops exceeding the design specifications. This paper provides a survey of the three main computation operations required to get these information.
Keywords :
current density; electromigration; integrated circuit interconnections; EM assessment; IR drops; current densities; full-chip estimation; full-chip power ground electromigration assessment; power map; thermal map; Computational modeling; Estimation; IP networks; Integrated circuit modeling; Thermal analysis; Thermal conductivity; Transistors; IR drop; power grid analysis; power map; thermal analysis; thermal map;
Conference_Titel :
Computer-Aided Design (ICCAD), 2014 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
DOI :
10.1109/ICCAD.2014.7001389
