DocumentCode :
1787760
Title :
Warranty-aware page management for PCM-based embedded systems
Author :
Sheng-Wei Cheng ; Yu-Fen Chang ; Yuan-Hao Chang ; Hsin-Wen Wei ; Wei-Kuan Shih
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2014
fDate :
2-6 Nov. 2014
Firstpage :
734
Lastpage :
741
Abstract :
The thriving growth in mobile consumer electronics makes energy efficiency in the embedded system design an important and recurring theme. Phase Change Memory (PCM) has shown its potential in replacing DRAM as the main memory option due to its (65%) reduced energy requirements. However, when considering the usage of PCM main memory, its write endurance becomes a critical issue, and wear leveling design is a common approach to resolve this issue. Even though the wear leveling design should stress operation efficiency and overhead reduction, existing wear leveling strategies designed for PCM main memory are usually dedicated to prolonging the lifetime of PCM. In this paper, we propose the perspective that, instead of valuing PCM lifetime exploitation as the first priority, we should turn to satisfy the product warranty period. To this end, further enhancement of operation efficiency and reduction of management overhead could be achieved. We thus propose a warranty-aware page management design to enhance the operation efficiency for managing the endurance issue in PCM. To show the effectiveness of the proposed design, we collected real traces on fiasco. OC by running SPEC2006 benchmarks with different write intensity workloads. The experiment results showed that our design reduced the overhead to one third of that of the state-of-the-art designs while still providing the same level of performance.
Keywords :
embedded systems; phase change memories; storage management chips; PCM-based embedded systems; management overhead reduction; nonvolatile memory; operation efficiency enhancement; phase change memory; warranty-aware page management; Arrays; Memory management; Phase change materials; Radiation detectors; Random access memory; Warranties;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2014 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/ICCAD.2014.7001433
Filename :
7001433
Link To Document :
بازگشت