• DocumentCode
    1788325
  • Title

    Integrated power electronics modules: Electro-thermal modeling flow and stress conditions overview

  • Author

    Raciti, Angelo ; Cristaldi, Davide ; Greco, Giuseppe ; Vinci, Giovanni ; Bazzano, Gaetano

  • Author_Institution
    Dept. of Electr., Electron. & Comput. Eng., Univ. of Catania, Catania, Italy
  • fYear
    2014
  • fDate
    18-19 Sept. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In recent years, power electronics solutions spread through fields ever less tied to a pure industrial context for embracing on-coming applications in consumer, automotive and renewable energy markets. In all those contexts several requirements drive engineers in implementing assemblies having increasingly strict constraints as high power density, optimal management of temperature, and a more and more compact and mechanically robust structure, so to guarantee a good degree of integration in the host system. In applications where the power to be managed is significant (tens to hundreds of kW), Integrated Power Electronics Modules (IPEMs) play a major role. These solutions, already extensively industrialized, well satisfy the above mentioned integration requirements, and allow the final customer to reduce power-management costs. In order to design an IPEM able to satisfy all the requirements it is necessary to have preliminary CAD models able to predict its behavior from several points of view. In this work, a layered modeling flow able to take into account both the electrical and thermal behavior is detailed. Moreover, a series of issues able to produce prospective mechanical stresses and related failure conditions are discussed.
  • Keywords
    cost reduction; power electronics; thermal stresses; CAD models; IPEM; electrical behavior; electrothermal modeling flow; integrated power electronics modules; mechanical stresses; power-management costs reduction; stress conditions; thermal behavior; Circuit faults; Integrated circuit modeling; Materials; Power electronics; Solid modeling; Stress; Wires; IPEM; PSpice model; failure condiction; mechanical stress; module; power electronic device;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AEIT Annual Conference - From Research to Industry: The Need for a More Effective Technology Transfer (AEIT), 2014
  • Conference_Location
    Trieste
  • Print_ISBN
    978-8-8872-3724-5
  • Type

    conf

  • DOI
    10.1109/AEIT.2014.7002016
  • Filename
    7002016