Title :
Effect of dopant concentration on the pore formation of porous silicon on n-type silicon
Author :
Nadia, Siti ; Ali, Nihad K. ; Ahmad, Mohd Ridzuan ; Haidary, Sazan M.
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. Malaysia, Skudai, Malaysia
Abstract :
This paper investigated the effect of different doped n-type silicon on pores formation. We found that star-like shape pores occurred when low doped concentration n-type silicon sample was used while high doped concentration produced normal pores hole-shape on the surface. By increasing etching time will cause the neighbouring star-like shape branches to combine and produced bigger pores. Reasons related on this star-like shape pores formation such as the effect of materials impurities, dynamic stress and space charge region effect (SCR) were discussed.
Keywords :
doping profiles; elemental semiconductors; etching; internal stresses; porous semiconductors; silicon; space charge; Si; dopant concentration; dynamic stress; etching time; materials impurities; n-type silicon; pore formation; porous silicon; space charge region effect; star-like shape pores; Current density; Etching; Shape; Silicon; Thyristors; Concentration; Dopant; N-Type Silicon; Porous;
Conference_Titel :
Photonics (ICP), 2014 IEEE 5th International Conference on
Conference_Location :
Kuala Lumpur
DOI :
10.1109/ICP.2014.7002308