• DocumentCode
    178901
  • Title

    Pose Independent Face Recognition by Localizing Local Binary Patterns via Deformation Components

  • Author

    Masi, Iacopo ; Ferrari, Carlo ; Del Bimbo, Alberto ; Medioni, Gerard

  • Author_Institution
    MICC, Univ. of Florence, Florence, Italy
  • fYear
    2014
  • fDate
    24-28 Aug. 2014
  • Firstpage
    4477
  • Lastpage
    4482
  • Abstract
    In this paper we address the problem of pose independent face recognition with a gallery set containing one frontal face image per enrolled subject while the probe set is composed by just a face image undergoing pose variations. The approach uses a set of aligned 3D models to learn deformation components using a 3D Morph able Model (3DMM). This further allows fitting a 3DMM efficiently on an image using a Ridge regression solution, regularized on the face space estimated via PCA. Then the approach describes each profile face by computing Local Binary Pattern (LBP) histograms localized on each deformed vertex, projected on a rendered frontal view. In the experimental result we evaluate the proposed method on the CMU Multi-PIE to assess face recognition algorithm across pose. We show how our process leads to higher performance than regular baselines reporting high recognition rate considering a range of facial poses in the probe set, up to ±45°. Finally we remark that our approach can handle continuous pose variations and it is comparable with recent state-of-the-art approaches.
  • Keywords
    face recognition; pose estimation; regression analysis; solid modelling; 3D morphable model; 3DMM; CMU multiPIE; LBP; PCA; continuous pose variations; deformation components; face image; face recognition algorithm; frontal face image; gallery set; local binary pattern histograms; local binary pattern localization; pose independent face recognition; pose variations; probe set; ridge regression solution; Deformable models; Face; Face recognition; Probes; Shape; Solid modeling; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2014 22nd International Conference on
  • Conference_Location
    Stockholm
  • ISSN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2014.766
  • Filename
    6977479