Title :
Speeding-up SIFT based copy move forgery detection using level set approach
Author :
Sudhakar, K. ; Sandeep, V.M. ; Kulkarni, Santosh
Author_Institution :
J.P.N. Coll. of Eng., Telangana, India
Abstract :
This paper presents an efficient method to detect Copy Move Forgery using SIFT features and the volume of these features is heavily reduced by Chan-Vese´s Level Set approach. Multiple-forged object detection, invariant to scale and rotation, high speed, its simplicity in implementation and robustness are some of this method´s strengths.
Keywords :
object detection; transforms; SIFT based copy move forgery detection; SIFT features; level set approach; multiple-forged object detection; scale invariant feature transform; Feature extraction; Forgery; Image edge detection; Image segmentation; Level set; Robustness; Time complexity; Chan-Vese Level Sets; Copy Move Forgery Detection; Key-points; Region of Interest; SIFT; Time complexity;
Conference_Titel :
Advances in Electronics, Computers and Communications (ICAECC), 2014 International Conference on
Conference_Location :
Bangalore
DOI :
10.1109/ICAECC.2014.7002407