Title :
Cartilage-defect assessment by measuring thickness of knee MRI: Data from the osteoarthritis initiative
Author :
Yong-woo Lee ; Bui Toan ; Chunsoo Ahn ; Jitae Shin
Author_Institution :
Sch. of Electron. & Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea
Abstract :
In this paper, we present a knee cartilage assessment technique to differentiate those in different osteoarthritis grades. We construct atlas for each grade and each atlas represents an average size of cartilage thickness. We build the atlas using manual segmentation of patellar cartilage following groupwise registration. We assign thickness value at the voxels in bone-cartilage interface in ahead. The thickness atlas is used for t-test to see how our method is accurate. T-test result shows our method finds significant difference between osteoarthritis grade 0 and 4 with p less than 0.001.
Keywords :
biomedical MRI; bone; diseases; image registration; image segmentation; medical image processing; statistical testing; thickness measurement; bone-cartilage interface; cartilage thickness; cartilage-defect assessment; image registration; knee MRI; knee cartilage assessment technique; knee thickness measurement; manual image segmentation; osteoarthritis grades; osteoarthritis initiative; patellar cartilage; t-test; thickness atlas; Bones; Educational institutions; Image registration; Magnetic resonance imaging; Manuals; Osteoarthritis; Thickness measurement; cartilage thickness; image registration; magnetic resonance imaging; osteoarthritis; osteoarthritis grade; t-test;
Conference_Titel :
Consumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
Conference_Location :
JeJu Island
DOI :
10.1109/ISCE.2014.6884524