Title :
Influence of the uncertainties on the scattering problems
Author :
Eyraud, C. ; Geffrin, J.-M.
Author_Institution :
Inst. Fresnel, Aix Marseille Univ., Marseille, France
Abstract :
In this paper, our particular focus is on the uncertainties impact on scattered field measurements. These uncertainties can be due to a non perfect knowledge on the object parameters or to the measurement procedure itself. The influence of these uncertainties is of great importance when one want to perform comparisons between EM experimental fields and simulated fields.
Keywords :
electromagnetic wave scattering; EM experimental field; EM simulated field; object parameter; scattered field measurement; Measurement uncertainty; Microwave measurement; Permittivity; Permittivity measurement; Position measurement; Scattering; Uncertainty;
Conference_Titel :
Antenna Measurements & Applications (CAMA), 2014 IEEE Conference on
Conference_Location :
Antibes Juan-les-Pins
DOI :
10.1109/CAMA.2014.7003410
