• DocumentCode
    1790739
  • Title

    Influence of the uncertainties on the scattering problems

  • Author

    Eyraud, C. ; Geffrin, J.-M.

  • Author_Institution
    Inst. Fresnel, Aix Marseille Univ., Marseille, France
  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, our particular focus is on the uncertainties impact on scattered field measurements. These uncertainties can be due to a non perfect knowledge on the object parameters or to the measurement procedure itself. The influence of these uncertainties is of great importance when one want to perform comparisons between EM experimental fields and simulated fields.
  • Keywords
    electromagnetic wave scattering; EM experimental field; EM simulated field; object parameter; scattered field measurement; Measurement uncertainty; Microwave measurement; Permittivity; Permittivity measurement; Position measurement; Scattering; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antenna Measurements & Applications (CAMA), 2014 IEEE Conference on
  • Conference_Location
    Antibes Juan-les-Pins
  • Type

    conf

  • DOI
    10.1109/CAMA.2014.7003410
  • Filename
    7003410