Verification and demonstration up to 67 GHz of an on-chip antenna pattern measurement setup

Author

Klein, Bernhard ; Jenning, Michael ; Seiler, Patrick ; Wolf, Klaus ; Plettemeier, Dirk

Author_Institution

Dept. of Electr. Eng. & Inf. Technol., Tech. Univ. Dresden, Dresden, Germany

fYear

2014

fDate

16-19 Nov. 2014

Firstpage

1

Lastpage

4

Abstract

In this paper, an antenna measurement setup built on a commercially available wafer prober is introduced. This setup allows to measure the radiation pattern of on-chip antennas up to 67 GHz. The measurements are performed in the near-field of the antenna under test and therefore a near-field to far-field transformation has been included. This transformation and the entire setup have been verified by a measurement of a standard gain horn antenna and further evaluated by a 2 by 2 patch array. The results show a high agreement with the simulation data.

Keywords

antenna accessories; antenna radiation patterns; antenna testing; horn antennas; microstrip antenna arrays; antenna under test; far-field transformation; horn antenna; near-field transformation; on-chip antenna pattern measurement setup demonstration; on-chip antenna pattern measurement setup verification; on-chip antenna radiation pattern; patch array; wafer prober; Antenna measurements; Electric variables measurement; Horn antennas; Probes; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Antenna Measurements & Applications (CAMA), 2014 IEEE Conference on

Conference_Location

Antibes Juan-les-Pins

Type

conf

DOI

10.1109/CAMA.2014.7003451

Filename

7003451