Title :
Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)
Author :
Chusseau, Laurent ; Omarouayache, Rachid ; Raoult, Jeremy ; Jarrix, Sylvie ; Maurine, P. ; Tobich, Karim ; Bover, Alexandre ; Vrignon, Bertrand ; Shepherd, John ; Thanh-Ha Le ; Berthier, Mael ; Riviere, Lionel ; Robisson, B. ; Ribotta, Anne-Lise
Author_Institution :
IES, Univ. Montpellier 2, Montpellier, France
Abstract :
Electromagnetic fault injections are produced on secured ICs aiming to break crypto codes. We describe in this paper the whole chain of optimization necessary to achieve this goal, namely 1/ physical optimization of near-field probe and setup, 2/ signal management in timing, shape, and localization to induce the fault while beating countermeasures and 3/ understanding of fault propagation in logic to eventually protect future ICs.
Keywords :
electromagnetic waves; integrated circuit technology; optimisation; reverse engineering; E-MATA HARI; IC logic; IC security; beating countermeasures; crypto codes; electromagnetic analysis; electromagnetic deciphering; electromagnetic fault injections; electromagnetic reverse engineering; fault propagation; integrated circuits; near-field probe; near-field setup; physical optimization; signal management; Circuit faults; Ferrites; Probes; Sensors; System-on-chip; Voltage measurement;
Conference_Titel :
Very Large Scale Integration (VLSI-SoC), 2014 22nd International Conference on
Conference_Location :
Playa del Carmen
DOI :
10.1109/VLSI-SoC.2014.7004189
