• DocumentCode
    1791906
  • Title

    Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

  • Author

    Oser, P. ; Spiezia, G. ; Brugger, M. ; Danzeca, S. ; Fadakis, E. ; Foucard, G. ; Garcia Alia, R. ; Losito, R. ; Masi, A. ; Mekki, J. ; Peronnard, P. ; Ruggiero, G. ; Secondo, R. ; Stachyra, K. ; Gaillard, R.

  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    In the context of the CERN ´Radiation To Electronics (R2E)´ project, the vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analysed. The tested parts include analog, linear, digital, and hybrid devices and a summary of radiation test results is provided in this paper.
  • Keywords
    Degradation; MOSFET; Neutrons; Protons; Radiation effects; Regulators; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris, France
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004559
  • Filename
    7004559
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791906