• DocumentCode
    1791908
  • Title

    Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

  • Author

    LaBel, Kenneth A. ; O´Bryan, Martha V. ; Dakai Chen ; Campola, Michael J. ; Casey, Megan C. ; Pellish, Jonathan A. ; Lauenstein, Jean-Marie ; Wilcox, Edward P. ; Topper, Alyson D. ; Ladbury, Raymond L. ; Berg, Melanie D. ; Gigliuto, Robert A. ; Boutte, Al

  • Author_Institution
    NASA/GSFC, Greenbelt, MD, USA
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects (SEE), proton-induced displacement damage (DD), and total ionizing dose (TID). This paper is a summary of test results.
  • Keywords
    radiation hardening (electronics); semiconductor device testing; space vehicle electronics; NASA; TID; candidate spacecraft electronics; displacement damage; heavy ion induced SEE; national aeronautics and space administration; proton-induced DD; radiation effect; single event effect; total ionizing dose; CMOS integrated circuits; Protons; Schottky diodes; Silicon; Testing; Voltage measurement; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004560
  • Filename
    7004560
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791908