• DocumentCode
    1791912
  • Title

    Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers

  • Author

    Irom, Farokh ; Agarwal, Shri G. ; Amrbar, Mehran

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This compendium reports on single-event latchup and total ionizing dose results for a variety of operational amplifiers targeted for possible use in NASA spacecraft. It covers devices tested over the last 15 years.
  • Keywords
    operational amplifiers; radiation hardening (electronics); NASA spacecraft; commercial operational amplifiers; compendium reports; radiation tolerant operational amplifiers; single-event latchup; total ionizing dose test; Conferences; Degradation; Laboratories; Operational amplifiers; Performance evaluation; Radiation effects; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004561
  • Filename
    7004561
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791912