Title :
Femtosecond Laser Simulation Facility for SEE IC Testing
Author :
Egorov, Andrey N. ; Chumakov, Alexander I. ; Mavritskiy, Oleg B. ; Pechenkin, Alexander A. ; Savchenkov, Dmitriy V. ; Telets, Vitaliy A. ; Yanenko, Andrey V.
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
The new SEE laser simulation facility based on femtosecond laser source with tunable pulse duration is presented, and its most important features are discussed. The influence of laser pulse duration on simulation results is observed.
Keywords :
integrated circuit testing; radiation hardening (electronics); SEE IC testing; femtosecond laser simulation facility; laser pulse duration; single event effect; tunable pulse duration; Integrated circuits; Laser beams; Laser modes; Measurement by laser beam; Radiation effects; Semiconductor lasers; Ultrafast optics;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004570
