• DocumentCode
    1791928
  • Title

    Femtosecond Laser Simulation Facility for SEE IC Testing

  • Author

    Egorov, Andrey N. ; Chumakov, Alexander I. ; Mavritskiy, Oleg B. ; Pechenkin, Alexander A. ; Savchenkov, Dmitriy V. ; Telets, Vitaliy A. ; Yanenko, Andrey V.

  • Author_Institution
    Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The new SEE laser simulation facility based on femtosecond laser source with tunable pulse duration is presented, and its most important features are discussed. The influence of laser pulse duration on simulation results is observed.
  • Keywords
    integrated circuit testing; radiation hardening (electronics); SEE IC testing; femtosecond laser simulation facility; laser pulse duration; single event effect; tunable pulse duration; Integrated circuits; Laser beams; Laser modes; Measurement by laser beam; Radiation effects; Semiconductor lasers; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004570
  • Filename
    7004570
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791928