Title :
Mirage: A New Proton Facility for the Study of Direct Ionization in Sub-100nm Technologies
Author :
Duzellier, S. ; Hubert, Guillaume ; Rey, R. ; Bezerra, F.
Author_Institution :
ONERA, Toulouse, France
Abstract :
A new proton beam line has been developed at ONERA for investigating radiation effects in electronics. Standard beams are used for studying cumulated effects in optoelectronics and photonics, low current configuration has been developed for studying direct ionization effects in advanced digital technologies.
Keywords :
integrated optics; proton beams; radiation effects; Mirage; ONERA; advanced digital technology; direct ionization effect; optoelectronics; photonics; proton beam line; proton facility; radiation effect; Current measurement; Ionization; PIN photodiodes; Particle beams; Protons; Silicon; Standards;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004578
