Title :
SEE Results of a Next Generation LEON 3FT Microprocessor
Author :
Hafer, C. ; Guertin, Steven M. ; Baranski, B. ; Butler, G. ; Nagy, J. ; Griffith, S. ; Jordan, A.
Abstract :
Special SEU test software is used to monitor the SEUs corrected by fault tolerant circuitry in the internal SRAM of the LEON 3FT processor. SEL immunity, SEU, and TID results are reviewed.
Keywords :
SRAM chips; fault tolerance; microprocessor chips; radiation hardening (electronics); SEE results; SEL immunity; SEU test software; TID results; fault tolerant circuitry; internal SRAM; next generation LEON 3FT microprocessor; Fault tolerance; Fault tolerant systems; Random access memory; Registers; Software; Springs; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004586
