DocumentCode
1791966
Title
SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities
Author
Anashin, Vasily S. ; Koziukov, Aleksandr E. ; Kazyakin, Anatoly A. ; Kuznetsov, Alexander S. ; Bakirov, Linaris R. ; Korolev, Viacheslav S. ; Artemyev, Kirill A. ; Faradian, Konstantin Zh
Author_Institution
Inst. of Space Device Eng. (Branch of URSC - ISDE), Branch of United Rocket & Space Corp., Moscow, Russia
fYear
2014
fDate
14-18 July 2014
Firstpage
1
Lastpage
4
Abstract
The paper presents SEE test results of electronic components foreseen to be used in the satellite equipment. They were provided to determine electronic components hardness level and also SETs studying and techniques to record them.
Keywords
aerospace test facilities; radiation hardening (electronics); space vehicle electronics; Roscosmos test facilities; SEE test; SETs; electronic component hardness level; satellite equipment; CMOS integrated circuits; Cyclotrons; Electronic components; Inspection; Radiation effects; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location
Paris
Print_ISBN
978-1-4799-5883-2
Type
conf
DOI
10.1109/REDW.2014.7004588
Filename
7004588
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