Title :
SEE Test Results of Electronic Components Performed on Roscosmos Test Facilities
Author :
Anashin, Vasily S. ; Koziukov, Aleksandr E. ; Kazyakin, Anatoly A. ; Kuznetsov, Alexander S. ; Bakirov, Linaris R. ; Korolev, Viacheslav S. ; Artemyev, Kirill A. ; Faradian, Konstantin Zh
Author_Institution :
Inst. of Space Device Eng. (Branch of URSC - ISDE), Branch of United Rocket & Space Corp., Moscow, Russia
Abstract :
The paper presents SEE test results of electronic components foreseen to be used in the satellite equipment. They were provided to determine electronic components hardness level and also SETs studying and techniques to record them.
Keywords :
aerospace test facilities; radiation hardening (electronics); space vehicle electronics; Roscosmos test facilities; SEE test; SETs; electronic component hardness level; satellite equipment; CMOS integrated circuits; Cyclotrons; Electronic components; Inspection; Radiation effects; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2014 IEEE
Conference_Location :
Paris
Print_ISBN :
978-1-4799-5883-2
DOI :
10.1109/REDW.2014.7004588
