• DocumentCode
    1791975
  • Title

    Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation

  • Author

    Hiemstra, David M. ; Kirischian, Valeri

  • Author_Institution
    MDA, Brampton, ON, Canada
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex-7 FPGA are presented. Upset rates in the space radiation environment are estimated.
  • Keywords
    SRAM chips; field programmable gate arrays; radiation hardening (electronics); FPGA; Kintex-7 field programmable gate array; SRAM; certain functional blocks; proton induced SEU cross-sections; proton irradiation; single event upset characterization; space radiation environment; upset rates; Field programmable gate arrays; Logic gates; Performance evaluation; Protons; Radiation effects; Random access memory; Single event upsets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004593
  • Filename
    7004593
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791975