• DocumentCode
    1791992
  • Title

    TID and SEE Characterization of Rad-Hardened 1.2GHz PLL IP from New ST CMOS 65nm Space Technology

  • Author

    Malou, Florence ; Gasiot, Gilles ; Chevallier, Remy ; Dugoujon, Laurent ; Roche, Philippe

  • Author_Institution
    Environ. & New Components, Centre Nat. d´Etudes Spatiales (CNES), Toulouse, France
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    We present Single Event Effects characterization and Total Ionizing Dose behavior up to 300 krad(Si) on Rad-Hardened 1.2GHz PLL IP and cold-spare I/O from new ST CMOS 65nm space technology.
  • Keywords
    CMOS analogue integrated circuits; UHF integrated circuits; industrial property; phase locked loops; radiation hardening (electronics); SEE characterization; ST CMOS space technology; TID characterization; cold-spare I-O; frequency 1.2 GHz; intellectual property; phase-locked loop; rad-hardened PLL IP; CMOS integrated circuits; CMOS technology; Clocks; Phase locked loops; Protons; Standards; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004601
  • Filename
    7004601
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791992